In response to the ongoing COVID-19 pandemic, this year's Collegiate Inventors Competition® (CIC) must adapt for the health and safety of our Finalists, Judges and event attendees.

With this understanding, we will be holding a virtual CIC event for 2020. Event details are currently in the works. Please contact [email protected] with any questions.

Judging

The Collegiate Inventors Competition Judging Process

Find out how we determine the winners.

Judging is completed in two rounds

Round 1

Each Collegiate Inventors Competition® (CIC) entry is reviewed by our initial judging panel made up of scientists, researchers and experts in a variety of fields.

The Judges’ collective scores and rankings, along with data collected by independent researchers, are used by the National Inventors Hall of Fame® (NIHF) to determine the Finalists. 

All Finalists are notified two months before the final judging round. 

Round 2

In October, Finalist teams meet with our final judging panel and formally present their inventions at the United States Patent and Trademark Office headquarters in Alexandria, Virginia. 

The final judging panel consists of NIHF Inductees and special guest Judges, which have included experts from the United States Patent and Trademark Office, the White House Office of Science and Technology Policy and Abbott Laboratories, among others.

Following the presentations, the judging panel deliberates and selects winners in each category.

Enter the Competition

Entries for the 2020 CIC are closed. Check back in the spring for information on the 2021 CIC.

Meet our 2020 Judges

NIHF Inductees

Eric R. Fossum

CMOS Active Pixel Image Sensor Camera-on-a-Chip
2011 NIHF Inductee

Marcian "Ted" Hoff

Microprocessor
1996 NIHF Inductee

Frances Ligler

Portable Optical Biosensors
2017 NIHF Inductee

Sumita Mitra

​​​​​​Nanocomposite Dental Materials
​​​​​​​2018 NIHF Inductee

Radia Perlman

Robust Network Routing and Bridging
2016 NIHF Inductee

Steve Sasson

Digital Camera
2011 NIHF Inductee

Spencer Silver

Post-it® Notes
2010 NIHF Inductee

United States Patent and Trademark Office

Jackie Cheng

Supervisory Patent Examiner

Scarlett Goon

Technology Center 1600 Quality Assurance Specialist